(Dr. Suresh K. Sitaraman, advisor)
"Physics-Based Process Modeling, Reliability Prediction, and Design Guidelines for Flip-Chip Devices"
Flip Chip on Board (FCOB) and Chip-Scale Packages (CSPs) are relatively new technologies that are being increasingly used in the electronic packaging industry. Compared to the more widely used face-up wirebonding and TAB technologies, flip-chips and most CSPs provide the shortest possible leads, lower inductance, higher frequency, better noise control, higher density, greater input/output (I/O), smaller device footprint and lower profile. However, due to the short history and due to the introduction of several new electronic materials, designs, and processing conditions, very limited work has been done to understand the role of material, geometry, and processing parameters on the reliability of flip-chip devices. Also, with the ever-increasing complexity of semiconductor packages and with the continued reduction in time to market, it is too costly to wait until the later stages of design and testing to discover that the reliability is not satisfactory.
The objective of the research is to develop integrated process-reliability
models that will take into consideration the mechanics of assembly processes
to be able to determine the reliability of face-down devices under thermal
cycling and long-term temperature dwelling. The models incorporate the
time and temperature-dependent constitutive behavior of various materials
in the assembly to be able to predict failure modes such as die cracking
and solder cracking. In addition, the models account for process-induced
defects and macro-micro features of the assembly. Creep-fatigue and
continuum-damage mechanics models for the solder interconnects and fracture-mechanics
models for the die have been used to determine the reliability of the devices.
The results predicted by the models have been successfully validated against
experimental data. The validated models have been used to develop qualification
and test procedures for implantable medical devices. In addition,
the research has helped develop innovative face-down devices without the
underfill, based on the thorough understanding of the failure modes.
Also, practical design guidelines for material, geometry and process parameters
for reliable flip-chip devices have been developed.